Chapter

Crystal growth and evaluation

Alexander Blake

in Crystal Structure Analysis

Second edition

Published in print June 2009 | ISBN: 9780199219469
Published online September 2009 | e-ISBN: 9780191722516 | DOI: http://dx.doi.org/10.1093/acprof:oso/9780199219469.003.0003

Series: International Union of Crystallography Texts on Crystallography

Crystal growth and evaluation

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This chapter describes techniques for obtaining and handling single crystals suitable for X-ray diffraction, including solvent evaporation, cooling, liquid and vapour diffusion methods, slow reaction techniques, and sublimation. Crystal quality can depend critically on factors such as counterions, substituents, and solvent molecules incorporated in the crystal structure. Crystal quality can be conveniently assessed with a polarizing microscope, though the ultimate test is the appearance of the X-ray diffraction pattern. For diffraction measurements, a secure crystal mounting can use glass fibres, capillaries, and specialized mounts, with a variety of adhesives including vitrified oils if low-temperature facilities are employed, and incorporates alignment tools to keep the crystal in the X-ray beam during rotation and exposure. Air-sensitive and low-melting crystals need special handling techniques.

Keywords: crystal growth; cooling; evaporation; diffusion; polarizing microscope; crystal quality; crystal mounting; crystal handling

Chapter.  5590 words.  Illustrated.

Subjects: Crystallography

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