Chapter

IMAGE PROCESSING AND SUPER-RESOLUTION SCHEMES

JOHN C. H. SPENCE

in High-Resolution Electron Microscopy

Third edition

Published in print October 2008 | ISBN: 9780199552757
Published online January 2010 | e-ISBN: 9780191708664 | DOI: http://dx.doi.org/10.1093/acprof:oso/9780199552757.003.0007

Series: Monographs on the Physics and Chemistry of Materials

 IMAGE PROCESSING AND SUPER-RESOLUTION SCHEMES

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This chapter describes methods intended to extend resolution beyond the Scherzer limit. Methods for combining images in a through-focus series are reviewed, and coherent detection with Wiener filtering explained. Optimization methods and incorporation of a-priori information are reviewed, and the connection with Baysian statistics is made. Several super-resolution methods are then outlined — tilt series, off-axis electron holography, combining imaging with diffraction data, ptychography, ronchigrams, shadow imaging, in-line holography, and diffractive imaging. Aberration correction is described (and expressions given for the optimum choice of focus and spherical aberration constant), and a section is given which summarizes approaches to the multiple-scattering inversion problem.

Keywords: through-focus series; tilt-series; super-resolution; ptychography; electron holography; ronchigrams; diffractive imaging; aberration correction

Chapter.  14164 words.  Illustrated.

Subjects: Atomic, Molecular, and Optical Physics

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