Chapter

ELECTRON SOURCES AND DETECTORS

JOHN C. H. SPENCE

in High-Resolution Electron Microscopy

Third edition

Published in print October 2008 | ISBN: 9780199552757
Published online January 2010 | e-ISBN: 9780191708664 | DOI: http://dx.doi.org/10.1093/acprof:oso/9780199552757.003.0009

Series: Monographs on the Physics and Chemistry of Materials

 ELECTRON SOURCES AND DETECTORS

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This chapter discusses and compares the three most common electron sources used in electron microscopy. Brightness, energy spread, and coherence properties are given for field emitters, LaB6, and thermal sources. The beam degeneracy is derived, and a method for measuring source brightness is given. (Field emission sources are brighter than current generation synchrotrons.) The self-biasing feedback system use is explained. The energy distribution of emitted electrons is compared for Schottky and Field emission. The second part of the chapter compares and analyses charge-coupled device (CCD) detectors, film detectors and Image Plates for electron beams. The gain, linearity, resolution, dynamic range, detective quantum efficiency, modulation transfer function (MTF), and number of pixels for each of these is discussed. Deconvolution methods for improving MTF, and the resolution trade-off are analysed. A final section on video recording and image intensifiers is included.

Keywords: field emission; brightness; lanthanum hexaboride; energy spread; coherence properties; Schottky emitter; CCD detector; film; image intensifier

Chapter.  8465 words.  Illustrated.

Subjects: Atomic, Molecular, and Optical Physics

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