Chapter

MEASUREMENT OF ELECTRON-OPTICAL PARAMETERS AFFECTING HIGH-RESOLUTION IMAGES

JOHN C. H. SPENCE

in High-Resolution Electron Microscopy

Third edition

Published in print October 2008 | ISBN: 9780199552757
Published online January 2010 | e-ISBN: 9780191708664 | DOI: http://dx.doi.org/10.1093/acprof:oso/9780199552757.003.0010

Series: Monographs on the Physics and Chemistry of Materials

 MEASUREMENT OF ELECTRON-OPTICAL PARAMETERS AFFECTING HIGH-RESOLUTION IMAGES

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This chapter discusses experimental methods for measuring the instrumental parameters on which high resolution images depend. These include defocus, objective lens current, spherical aberration constant, magnification calibration, chromatic aberration constant, astigmatism, diffractogram analysis, coherence width, electron wavelength, camera length, and resolution.

Keywords: focus setting; spherical aberration measurement; magnification calibration; chromatic aberration measurement; astigmatism measurement; diffractogram analysis; coherence width; electron wavelength

Chapter.  8929 words.  Illustrated.

Subjects: Atomic, Molecular, and Optical Physics

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