Chapter

INSTABILITIES AND THE MICROSCOPE ENVIRONMENT

JOHN C. H. SPENCE

in High-Resolution Electron Microscopy

Third edition

Published in print October 2008 | ISBN: 9780199552757
Published online January 2010 | e-ISBN: 9780191708664 | DOI: http://dx.doi.org/10.1093/acprof:oso/9780199552757.003.0011

Series: Monographs on the Physics and Chemistry of Materials

 INSTABILITIES AND THE MICROSCOPE ENVIRONMENT

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This chapter concerns the electrical and mechanical stability of the site chosen for the electron microscope if atomic resolution results are expected. Limits on stray magnetic and electrical fields are discussed, and the methods to measure them. Methods for identifying and measuring high voltage instability, mechanical vibration, sample movement, contamination, and temperature drift are all discussed.

Keywords: stray fields; magnetic fields; high voltage instability; mechanical vibration; sample movement

Chapter.  4866 words.  Illustrated.

Subjects: Atomic, Molecular, and Optical Physics

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