This chapter describes some of the techniques which can be combined with high resolution electron microscopy to give more information about the sample. These include X-ray microanalysis and channelling effects (atom location by channelling enhanced microanalysis), coherent bremsstahlung, electron energy-loss spectroscopy for compositional mapping, delocalization, near-edge structure, quantitative convergent-beam electron diffraction, electron microdiffraction, charge-density mapping, and coherent nanodiffraction when the probe becomes smaller than one unit cell of a crystal. The chapter ends...

This chapter describes some of the techniques which can be combined with high resolution electron microscopy to give more information about the sample. These include X-ray microanalysis and channelling effects (atom location by channelling enhanced microanalysis), coherent bremsstahlung, electron energy-loss spectroscopy for compositional mapping, delocalization, near-edge structure, quantitative convergent-beam electron diffraction, electron microdiffraction, charge-density mapping, and coherent nanodiffraction when the probe becomes smaller than one unit cell of a crystal. The chapter ends with sections on cathodoluminescence in STEM and on environmental electron microscopy.