Chapter

ASSOCIATED TECHNIQUES

JOHN C. H. SPENCE

in High-Resolution Electron Microscopy

Third edition

Published in print October 2008 | ISBN: 9780199552757
Published online January 2010 | e-ISBN: 9780191708664 | DOI: http://dx.doi.org/10.1093/acprof:oso/9780199552757.003.0013

Series: Monographs on the Physics and Chemistry of Materials

 ASSOCIATED TECHNIQUES

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This chapter describes some of the techniques which can be combined with high resolution electron microscopy to give more information about the sample. These include X-ray microanalysis and channelling effects (atom location by channelling enhanced microanalysis), coherent bremsstahlung, electron energy-loss spectroscopy for compositional mapping, delocalization, near-edge structure, quantitative convergent-beam electron diffraction, electron microdiffraction, charge-density mapping, and coherent nanodiffraction when the probe becomes smaller than one unit cell of a crystal. The chapter ends with sections on cathodoluminescence in STEM and on environmental electron microscopy.

Keywords: X-ray microanalysis; ALCHEMI; channelling; energy-loss spectroscopy; spectrum imaging; delocalization; near-edge structure; coherent nanodiffraction; cathodoluminescence

Chapter.  12854 words.  Illustrated.

Subjects: Atomic, Molecular, and Optical Physics

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