Chapter

Fundamental transmission electron microscopy

Xiaodong Zou, Sven Hovmöller and Peter Oleynikov

in Electron Crystallography

Published in print August 2011 | ISBN: 9780199580200
Published online January 2012 | e-ISBN: 9780191731211 | DOI: http://dx.doi.org/10.1093/acprof:oso/9780199580200.003.0004

Series: International Union of Crystallography Texts on Crystallography

Fundamental transmission electron microscopy

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Fundamental transmission electron microscopy covers the topics of resolution, electron optics, image recording systems and image distortions and how they can be handled by hardware (Cs-correctors) and software. The interaction of electrons with matter starts with the individual atom and the atomic scattering factor. Special emphasis is placed on elastically scattered electrons, since those are the ones used for forming images of the atomic structure. The use of inelastically scattered electrons is briefly mentioned, for example in HAADF – high-angle annular dark field imaging of atomic structure.

Keywords: resolution; electron optics; image formation; image recording; elastic scattering; inelastic scattering; Cs-correctors; atomic scattering factor

Chapter.  6195 words.  Illustrated.

Subjects: Crystallography

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