structure factor

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A quantity denoted Fhkl, where h, k, and l are the Miller indices of the crystal, which occurs in X-ray crystallography and other experiments involving scattering in crystals. Fhkl is defined by the equation:Fhklfiexp[2πi(hxi+kyi+lzi)], where the sum is over all atoms of the unit cell and fi is the scattering factor for atom i defined by:fi=4Π0(ρsinkr/kr)r2dr Here k=4Πsinθ/λ, where θ is the Bragg angle (see Bragg's law), λ is the wavelength of the X-rays, and ρ is the electron density distribution of the atom i. The structure factor is used in Patterson synthesis.



Subjects: Chemistry.

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