Journal Article

Detective quantum efficiency of the 25 μm pixel size Imaging Plate for transmission electron microscopes

Akira Taniyama, Daisuke Shindo and Tetsuo Oikawa

in Microscopy

Published on behalf of The Japanese Society of Microscopy

Volume 46, issue 4, pages 303-310
Published in print January 1997 | ISSN: 2050-5698
Published online January 1997 | e-ISSN: 2050-5701 | DOI: http://dx.doi.org/10.1093/oxfordjournals.jmicro.a023523
Detective quantum efficiency of the 25 μm pixel size Imaging Plate for transmission electron microscopes

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The signal to noise ratio (S/N) and the detective quantum efficiency (DQE) of the 25 μm pixel Imaging Plate for transmission electron microscopy (TEM) were measured as a function of the number of incident electrons. The S/N increased with increasing the number of incident electrons, but tended to saturate in high exposure region, although the good linearity between the number of incident electrons and image signal was reserved in the region. The DQE at 100 kV and 200 kV had the maximum values of about 70% and 45% under high gain mode, and about 20% and 10% under low gain mode, respectively. The DQE at 600 kV had the maximum value of ˜30%, while that at 1250 kV had ˜5%. Comparing the S/N curves with the DQE curves, the optimum electron intensity regions for high quality TEM images were discussed.

Keywords: Imaging Plate (IP); signal to noise ratio (S/N); detective quantum efficiency (DQE); recording device; quantitative analysis; TEM

Journal Article.  0 words. 

Subjects: Biological Sciences

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