Journal Article

Determination of the X-ray reflection emissivity profile of 1H 0707-495

D. R. Wilkins and A. C. Fabian

in Monthly Notices of the Royal Astronomical Society

Published on behalf of The Royal Astronomical Society

Volume 414, issue 2, pages 1269-1277
Published in print June 2011 | ISSN: 0035-8711
Published online June 2011 | e-ISSN: 1365-2966 | DOI: http://dx.doi.org/10.1111/j.1365-2966.2011.18458.x
Determination of the X-ray reflection emissivity profile of 1H 0707-495

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When considering the X-ray spectrum resulting from the reflection off the surface of accretion discs of AGN, it is necessary to account for the variation in reflected flux over the disc, i.e. the emissivity profile. This will depend on factors including the location and geometry of the X-ray source and the disc characteristics. We directly obtain the emissivity profile of the disc from the observed spectrum by considering the reflection component as the sum of contributions from successive radii in the disc and fitting to find the relative weightings of these components in a relativistically broadened emission line. This method has successfully recovered known emissivity profiles from synthetic spectra and is applied to XMM–Newton spectra of the Narrow Line Seyfert 1 galaxy 1H 0707-495. The data imply a twice-broken power-law form of the emissivity law with a steep profile in the inner regions of the disc (index 7.8) and then a flat region between 5.6 and 34.8rg before tending to a constant index of 3.3 over the outer regions of the disc. The form of the observed emissivity profile is consistent with theoretical predictions, thus reinforcing the reflection interpretation.

Keywords: accretion, accretion discs; black hole physics; line: profiles; X-rays: general

Journal Article.  6385 words.  Illustrated.

Subjects: Astronomy and Astrophysics

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